Subject Code: ML3L006 Name: Materials Characterization L-T-P: 3-0-0 Credit:3
Pre-Requisite(s): None
Introduction: Importance of Characterization in Metallurgy and Materials Engineering, Structural and Functional Characterizations, Review of Crystallography.
X-ray Diffraction: Laue Equations and Bragg’s Law, Reciprocal space, Ewald sphere construction, Diffraction analysis: Atomic scattering factors, scattering by the unit cell, Structure factor, diffraction intensities, X-diffraction methods- Powder diffraction, single crystal Laue diffraction, rotating single crystal method, Thin film analysis, Scherrer formula and grain size determination.
Optical Microscopy: special microscopy techniques.
Scanning Electron Microscopy: Fundamentals principles of SEM, sample preparation techniques, SE and BSE imaging modes, X-ray mapping and Fractography.
Transmission Electron Microscopy: Wave properties of electron, electron-matter interactions, Ring patterns, spot patterns, Laue zones, Resolution limitation and lens aberrations, The origin of contrast: mass-thickness contrast, diffraction contrast and crystal defect analysis, BF, DF, sample preparation techniques.
Thermal Analysis: Thermometric Titration (TT), Thermal Mechanical Analysis (TMA), Differential Scanning Calorimetric (DSC), Thermal Gravimetric Analysis (TGA), Differential Thermal Analysis (DTA).
Introduction to Specialized techniques: AES, FIB, PPMS, Raman spectroscopy
Non-destructive testing of materials: Theory of mechanical waves, Application in Ultrasonic testing, die penetration test, magnetic particle inspection, eddy current testing, radiography
Texts and References:
  1. L.V. Azaroff,Introduction to solids, McGraw-Hill Book Company, 2001.
  2. B.D. Cullity and S.R. Stocks, Elements of X-ray diffraction, Addison-Wesley Publishing Co., 1959.
  3. M.J. Buerger, Elementary Crystallography, 1956.
  4. E.J. Mittemeijer, Fundamentals of Materials Science-the microstructure-property relationship using metals as model systems, Springer, 2010.
  5. D. B. Williams and C. Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Springer; 2nd edition 2009.
  6. Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R., Scanning Electron Microscopy and X-ray Microanalysis: Third Edition, Springer US, 2003.
  7. Gradiner and Graves(Ed.), Practical Raman Spectroscopy, Springer, 1989.
  8. GüntherHöhne, Wolfgang F. Hemminger , H.-J. Flammersheim, Differential Scanning Calorimetry, Springer, 2003.