Subject Code: ML4L007	Name: Crystallography and X-ray diffraction	L-T-P:3-0-0	Credit:3
Pre-Requisites: Materials characterization (course)
Crystallography and real materials: lattice, motif, unit cells and crystal structures, symmetry elements, point groups, space groups, point defects, dislocations, grain boundary, twinning; X-Ray Diffraction: Wave theory and electromagnetic waves, Bragg’s law and Laue equation, reciprocal space and its application; single crystal diffraction method and application, powder diffraction method and application, indexing of powder diffraction patterns, Rietveld analysis.
Text/Reference Books: B. E. Warren, X-Ray Diffraction, 2002. B. D. Cullity, S.R. Stock, Elements of X-ray diffraction, 1959. J.M. Buerger, Elementary Crystallography: An Introduction to the Fundamental Geometrical Features of Crystals, 1956. F. C. Phillips, AnIntroduction to Crystallography, 2011. F. M. Norman, and K. Lonsdale, International Tables for X-Ray Crystallography. Vol. 1, International Tables for Crystallography/ Volumes A(2006) / A1(2011) / B(2010) / C(2006) / D(2006) / E(2010) / F(2012) / G(2006)