Production and detection of    X-rays; Crystallography: lattice, motif, unit cells and crystal structures,    symmetry elements, point groups, space groups, defects; Diffraction: Wave    theory and electromagnetic waves, single crystal diffraction method and    applications, powder diffraction method and applications, indexing of powder    diffraction patterns, Bragg’s law and Laue equation, reciprocal space and its    application; Fourier transforms: analysis of diffraction patterns, structure    factor and pair distribution function; Determination of crystal structures    from symmetry and geometry; Rietveld method and precise crystal structures;    Qualitative and quantitative phase identification.
      
      
      Texts / Reference Books: 
      
        - B. E. Warren, X-Ray Diffraction.
 
        - B. D. Cullity, S.R.         Stock, Elements of X-ray diffraction.
 
        - Buerger, Martin J, Elementary Crystallography: An Introduction to the Fundamental         Geometrical Features of Crystals.
 
        - F. C. Phillips, An Introduction to Crystallography.
 
        - Norman ,F. M., and         Kathleen Lonsdale, International Tables for X-Ray Crystallography. Vol. 1
 
        - International Tables for Crystallography/ Volumes A(2006) /         A1(2011) / B(2010) / C(2006)/ D(2006) / E(2010) / F(2012) / G(2006).
 
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